| 1 |
Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O-2(+) ion bombardment
Yan XL, Duvenhage MM, Wang JY, Swart HC, Terblans JJ
Thin Solid Films, 669, 188, 2019 |
| 2 |
Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films
Yan XL, Coetsee E, Wang JY, Swart HC, Terblans JJ
Applied Surface Science, 411, 73, 2017 |
| 3 |
Enhanced ferroelectric photovoltaic effect based on converging depolarization field
Gao RL, Cai W, Chen G, Deng XL, Cao XL, Fu CL
Materials Research Bulletin, 84, 93, 2016 |
| 4 |
Properties of CrN/Mo2N nano-multilayer films synthesized by multi-cathodic arc ion plating system
Han B, Pelenovich VO, Yousaf MI, Yan SJ, Wang W, Zhou SY, Yang B, Ai ZW, Liu CS, Fu DJ
Thin Solid Films, 619, 160, 2016 |
| 5 |
Effect of light-soaking on the hydrogen effusion mechanisms in polymorphous silicon thin film structures
Hamui L, Monroy BM, Cabarrocas RRI, Santana G
Materials Chemistry and Physics, 163, 311, 2015 |
| 6 |
Photoconductive UV detectors based heterostructures of Cd and Mg doped ZnO sol gel thin films
Vettumperumal R, Kalyanaraman S, Thangavel R
Materials Chemistry and Physics, 145(1-2), 237, 2014 |
| 7 |
Enhancement of the barrier performance in organic/inorganic multilayer thin-film structures by annealing of the parylene layer
Kim N, Graham S, Hwang KJ
Materials Research Bulletin, 58, 24, 2014 |
| 8 |
Fabrication, characterization and electrochemistry of organic-inorganic multilayer films containing polyoxometalate and polyviologen via layer-by-layer self-assembly
Zhang HY, Miao AJ, Jiang M
Materials Chemistry and Physics, 141(1), 482, 2013 |
| 9 |
SiNx thickness dependent morphology and mechanical properties of CrAlN/SiNx nanomultilayers
Li W, Liu P, Zhao YS, Zhang K, Ma FC, Liu XK, Chen XH, He DH
Thin Solid Films, 534, 367, 2013 |
| 10 |
Surfactant influence on interface roughness and magnetoresistance value in Fe/Cr multilayers
Kac M, Polit A, Dobrowolska A, Zabila Y, Krupinski M, Marszalek M
Thin Solid Films, 542, 199, 2013 |
