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| No. | Article |
|---|---|
| 1 |
Impact of strain and source/drain engineering on the low frequency noise behaviour in n-channel tri-gate FinFETs Guo W, Cretu B, Routoure JM, Carin R, Simoen E, Mercha A, Collaert N, Put S, Claeys C Solid-State Electronics, 52(12), 1889, 2008 |