검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Excess carrier lifetime mapping for bulk SiC wafers by microwave photoconductivity decay method and its relationship with structural defect distribution Kato M, Ichimura M, Arai E, Sumie S, Hashizume H Materials Science Forum, 457-460, 505, 2004 |