검색결과 : 1건
No. | Article |
---|---|
1 |
Electric field effects associated with the backside Ge profile in SiGeHBTs Zhang G, Cressler JD, Lanzerotti L, Johnson R, Jin ZR, Zhang SM, Niu GF, Joseph A Solid-State Electronics, 46(5), 655, 2002 |
No. | Article |
---|---|
1 |
Electric field effects associated with the backside Ge profile in SiGeHBTs Zhang G, Cressler JD, Lanzerotti L, Johnson R, Jin ZR, Zhang SM, Niu GF, Joseph A Solid-State Electronics, 46(5), 655, 2002 |