| 1 |
Model Evaluation for Robust Tracking Under Unknown Upper Bounds on Perturbations and Measurement Noise
Sokolov VF
IEEE Transactions on Automatic Control, 59(2), 483, 2014 |
| 2 |
A quantum mechanical treatment of low frequency noise in high-K NMOS transistors with ultra-thin gate dielectrics
Zhang XC, White MH
Solid-State Electronics, 78, 131, 2012 |
| 3 |
Microwave noise modeling of FinFETs
Crupi G, Caddemi A, Schreurs DMMP, Wiatr W, Mercha A
Solid-State Electronics, 56(1), 18, 2011 |
| 4 |
Direct parameter-extraction method for MOSFET noise model from microwave noise figure measurement
Gao JJ
Solid-State Electronics, 63(1), 42, 2011 |
| 5 |
A new analytical high frequency noise parameter model for AlGaN/GaN HEMT
Cheng XX, Wang Y
Solid-State Electronics, 54(11), 1300, 2010 |
| 6 |
Impact of forward and reverse deep n-well biasing on the 1/f noise of 0.13 mu m n-channel MOSFETs in triple well technology
Png LC, Chew KW, Yeo KS
Solid-State Electronics, 53(6), 599, 2009 |
| 7 |
Physics-based 1/f noise model for MOSFETs with nitrided high-kappa gate dielectrics
Morshed TH, Devireddy SP, Celik-Butler Z, Shanware A, Green K, ChamberS JJ, Visokay MR, Colombo L
Solid-State Electronics, 52(5), 711, 2008 |
| 8 |
Box-Jenkins identification revisited - Part III multivariable systems
Pintelon R, Schoukens J, Guillaume P
Automatica, 43(5), 868, 2007 |
| 9 |
Realistic model of a solid-substrate fermentation packed-bed pilot bioreactor
Fernandez-Fernandez M, Perez-Correa JR
Process Biochemistry, 42(2), 224, 2007 |
| 10 |
Box-Jenkins identification revisited - Part 1: Theory
Pintelon R, Schoukens J
Automatica, 42(1), 63, 2006 |
