검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Structural characterisation of Sb-based heterostructures by X-ray scattering methods Renard C, Durand O, Marcadet X, Massies J, Parillaud O Applied Surface Science, 253(1), 112, 2006 |
| 2 |
Fourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures Durand O, Morizet N Applied Surface Science, 253(1), 133, 2006 |
| 3 |
Importance of pulse reversal effect of CdSe thin films for optoelectronic devices Saaminathan V, Murali KR Journal of Crystal Growth, 279(3-4), 229, 2005 |
| 4 |
Characterization of multilayered materials for optoelectronic components by high-resolution X-ray diffractometry and reflectometry: contribution of numerical treatments Durand O Thin Solid Films, 450(1), 51, 2004 |
| 5 |
Photoluminescent, wide-bandgap a-SiC : H alloy films deposited by Cat-CVD using acetylene Kumbhar A, Patil SB, Kumar S, Lal R, Dusane RO Thin Solid Films, 395(1-2), 244, 2001 |