검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
The impact of stress-induced defects on MOS electrostatics and short-channel effects Esqueda IS Solid-State Electronics, 103, 167, 2015 |
| 2 |
A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits Esqueda IS, Barnaby HJ Solid-State Electronics, 91, 81, 2014 |
| 3 |
Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs Aleksic SM, Jaksic AB, Pejovic MM Solid-State Electronics, 52(8), 1197, 2008 |
| 4 |
Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing Ristic GS, Pejovic MM, Jaksic AB Applied Surface Science, 252(8), 3023, 2006 |
| 5 |
Fowler-Nordheim high electric field stress of power VDMOSFETs Ristic GS, Pejovic MM, Jaksic AB Solid-State Electronics, 49(7), 1140, 2005 |
| 6 |
Modelling of radiation response of p-channel SiC MOSFETs Lee KK, Ohshima T, Itoh H Materials Science Forum, 433-4, 761, 2002 |