검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001) Hartman JD, Naniwae K, Petrich C, Ramachandran V, Feenstra RM, Nemanich RJ, Davis RF Materials Science Forum, 338-3, 353, 2000 |
| No. | Article |
|---|---|
| 1 |
Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001) Hartman JD, Naniwae K, Petrich C, Ramachandran V, Feenstra RM, Nemanich RJ, Davis RF Materials Science Forum, 338-3, 353, 2000 |