검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Photoelectrical measurements of the local value of the contact potential difference in the metal-insulator semiconductor (MIS) structures Kudla A, Przewlocki HM, Borowicz L, Brzezinska D, Rzodkiewicz W Thin Solid Films, 450(1), 203, 2004 |
| 2 |
Application of the genetic algorithms in spectroscopic ellipsometry Kudla A Thin Solid Films, 455-56, 804, 2004 |