검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Determination of the thickness and density of the ion bombardment induced altered layer in SiC by means of reflection electron energy loss study Kotis L, Sulyok A, Menyhard M, Malherbe JB, Odendaal RQ Applied Surface Science, 252(5), 1785, 2005 |