검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Preferential sputtering effects in depth profiling of multilayers with SIMS, XPS and AES Hofmann S, Zhou G, Kovac J, Drev S, Lian SY, Lin B, Liu Y, Wang JY Applied Surface Science, 483, 140, 2019 |
| 2 |
Prediction and experimental determination of the layer thickness in SIMS depth profiling of Ge/Si multilayers: Effect of preferential sputtering and atomic mixing Lian SY, Kim KJ, Kim TG, Hofmann S, Wang JY Applied Surface Science, 481, 1103, 2019 |
| 3 |
Depth resolution and preferential sputtering in depth profiling of delta layers Hofmann S, Lian SY, Han YS, Liu Y, Wang JY Applied Surface Science, 455, 1045, 2018 |
| 4 |
Correlation of depth resolution and preferential sputtering in depth profiles of thin layers by Secondary Ion Mass Spectrometry (SIMS) Hofmann S, Lian SY, Han YS, Deng QR, Wang JY Thin Solid Films, 662, 165, 2018 |
| 5 |
Depth resolution and preferential sputtering in depth profiling of sharp interfaces Hofmann S, Han YS, Wang JY Applied Surface Science, 410, 354, 2017 |
| 6 |
Understanding the effects of sputter damage in W-S thin films by HAXPES Sundberg J, Lindblad R, Gorgoi M, Rensmo H, Jansson U, Lindblad A Applied Surface Science, 305, 203, 2014 |
| 7 |
Low energy Ar-ion bombardment effects on the CeO2 surface Wang GD, Kong DD, Pan YH, Pan HB, Zhu JF Applied Surface Science, 258(6), 2057, 2012 |
| 8 |
Formation of self-organized nanostructures on semi-insulating InP by 100 keV Ar+-ion irradiation Mohanty JR, Basu T, Kanjilal D, Som T Applied Surface Science, 258(9), 4139, 2012 |
| 9 |
Composition of the sputter deposited W-Ti thin films Bundaleski N, Petrovic S, Perusko D, Kovac J, Zalar A Applied Surface Science, 254(20), 6390, 2008 |
| 10 |
Time dependent preferential sputtering in the HfO2 layer on Si(100) Chang SJ, Lee WC, Hwang J, Hong M, Kwo J Thin Solid Films, 516(6), 948, 2008 |