검색결과 : 1건
No. | Article |
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1 |
Effects of plasma nitridation on ultra-thin gate oxide electrical and reliability characteristics He YD, Xu MZ, Tan CH Solid-State Electronics, 49(1), 57, 2005 |
No. | Article |
---|---|
1 |
Effects of plasma nitridation on ultra-thin gate oxide electrical and reliability characteristics He YD, Xu MZ, Tan CH Solid-State Electronics, 49(1), 57, 2005 |