검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
System-level read disturb suppression techniques of TLC NAND flash memories for Read-Hot/Cold data mixed applications Watanabe H, Deguchi Y, Kobayashi A, Matsui C, Takeuchi K Solid-State Electronics, 147, 63, 2018 |
| 2 |
A comprehensive analysis on scaling prospects of dual-bit channel engineered SONOS NOR-flash EEPROM cells Datta A, Mahapatra S Solid-State Electronics, 54(4), 397, 2010 |
| 3 |
Charge trapping memory structures with Al2O3 trapping dielectric for high-temperature applications Specht M, Reisinger H, Hofmann F, Schulz T, Landgraf E, Luyken RJ, Rosner W, Grieb M, Risch L Solid-State Electronics, 49(5), 716, 2005 |
| 4 |
Reliability implications in advanced embedded two-transistor-Fowler-Nordheim-NOR flash memory devices Scarpa A, Tao G, Dijkstra J, Kuper FG Solid-State Electronics, 46(11), 1765, 2002 |