화학공학소재연구정보센터
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No. Article
1 Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry
Franta D, Ohlidal I, Bursikova V, Zajickova L
Thin Solid Films, 455-56, 393, 2004
2 In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE
Stifter D, Bonanni A, Garcia-Rocha M, Schmid M, Hingerl K, Sitter H
Thin Solid Films, 373(1-2), 41, 2000
3 Optical spectroscopy of near-surface excitonic states
Azucena-Coyotecatl H, Grigorieva NR, Kazennov BA, Madrigal-Melchor J, Novikov BV, Perez-Rodriguez F, Sel'kin AV
Thin Solid Films, 373(1-2), 227, 2000
4 Detection of cobalt silicide phase formations by ultrafast optical measurements
Lavoie C, Cabral C, Harper JME, Tas G, Morath CJ, Stoner RJ, Maris HJ
Thin Solid Films, 374(1), 42, 2000
5 An absorbing fractal film set
Li Y, He DR
Thin Solid Films, 375(1-2), 188, 2000
6 Driving force controlling liquid crystal alignment on photochromic polyion complex LB film
Kawai T
Thin Solid Films, 352(1-2), 228, 1999
7 FTIR reflection absorption spectroscopy for organic thin film on ITO substrate
Tamada M, Koshikawa H, Hosoi F, Suwa T
Thin Solid Films, 315(1-2), 40, 1998