1 |
Atomic-resolution study on the interface structure and strain state reversion of the Bi2Sr2CuO6+delta/MgO heterostructure Zhang J, Wang WZ, Wang N, Wang MG, Qi Y Journal of Colloid and Interface Science, 592, 291, 2021 |
2 |
Mechanical characteristics of well cement under cyclic loading and its influence on the integrity of shale gas wellbores Zhou SM, Liu RG, Zeng H, Zeng YJ, Zhang LH, Zhang JY, Li XJ Fuel, 250, 132, 2019 |
3 |
NiTi and reused pseudo elastic reinforcing bar for improved cyclic strains, energy dissipation, damping properties and earthquake resilience Abd Hamid NA Molecular Crystals and Liquid Crystals, 695(1), 53, 2019 |
4 |
NiTi and reused pseudo elastic reinforcing bar for improved cyclic strains, energy dissipation, damping properties and earthquake resilience Abd Hamid NA Molecular Crystals and Liquid Crystals, 695(1), 53, 2019 |
5 |
Residual strain measurement of Cu2ZnSnS4 thin film using X-ray line broadening Kim C, Hong S Molecular Crystals and Liquid Crystals, 663(1), 21, 2018 |
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Comparison of different grading schemes in InGaAs metamorphic buffers on GaAs substrate: Tilt dependence on cross-hatch irregularities Kumar R, Bag A, Mukhopadhyay P, Das S, Biswas D Applied Surface Science, 357, 922, 2015 |
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Thermal stress induced dislocation distribution in directional solidification of Si for PV application Jiptner K, Gao B, Harada H, Miyamura Y, Fukuzawa M, Kakimoto K, Sekiguchi T Journal of Crystal Growth, 408, 19, 2014 |
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Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film Bartosik M, Daniel R, Mitterer C, Matko I, Burghammer M, Mayrhofer PH, Keckes J Thin Solid Films, 542, 1, 2013 |
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Electrical properties of a-Si:H thin films as a function of bonding configuration Kim DY, Kim IS, Choi SY Solar Energy Materials and Solar Cells, 93(2), 239, 2009 |
10 |
Determinability of complete residual strain tensor from multiple CBED patterns Morawiec A Materials Science Forum, 524-525, 115, 2006 |