검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Formation of polycrystalline-Si thin-film-transistors with a retrograde channel doping profile Juang MH, Cheng SH, Jang SL Solid-State Electronics, 53(3), 371, 2009 |
| 2 |
The influence of junction depth on short channel effects in vertical sidewall MOSFETs Tan L, Buiu O, Hall S, Gill E, Uchino T, Ashburn P Solid-State Electronics, 52(7), 1002, 2008 |
| 3 |
Process technique for SEU reliability improvement of deep sub-micron SRAM cell Saxena PK, Bhat N Solid-State Electronics, 47(4), 661, 2003 |
| 4 |
Impact of gate workfunction on device performance at the 50 nm technology node De I, Johri D, Srivastava A, Osburn CM Solid-State Electronics, 44(6), 1077, 2000 |