검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Measurement and device simulation of avalanche breakdown in high-voltage 4H-SiC diodes including the influence of macroscopic defects Domeij M, Brunahl H, Ostling M Materials Science Forum, 389-3, 1277, 2002 |
| No. | Article |
|---|---|
| 1 |
Measurement and device simulation of avalanche breakdown in high-voltage 4H-SiC diodes including the influence of macroscopic defects Domeij M, Brunahl H, Ostling M Materials Science Forum, 389-3, 1277, 2002 |