검색결과 : 35건
| No. | Article |
|---|---|
| 1 |
Enhancing Cu-Cu Diffusion Bonding at Low Temperature Via Application of Self-assembled Monolayer Passivation Lim DF, Goulet SK, Bergkvist M, Wei J, Leong KC, Tan CS Journal of the Electrochemical Society, 158(10), H1057, 2011 |
| 2 |
Low Resistance CrB2/Ti/Al Ohmic Contacts to N-face n-GaN for High Power GaN-Based Vertical Light Emitting Diodes Park SH, Jeon JW, Lee SY, Moon J, Song JO, Seong TY Electrochemical and Solid State Letters, 13(10), H333, 2010 |
| 3 |
Adhesion Degradation and Water Diffusion in Nanoporous Organosilicate Glass Thin Film Stacks Lin YB, Tsui TY, Vlassak JJ Journal of the Electrochemical Society, 157(2), G53, 2010 |
| 4 |
Bulk Migration of Ni/NiO in Ni-YSZ during Reducing Conditions Saraf LV, Baer DR, Lea AS, Zhu ZH, Strohm JJ, Sitzman SD, King DL Journal of the Electrochemical Society, 157(4), B463, 2010 |
| 5 |
Chromium Poisoning and Degradation at (La,Sr)MnO3 and (La,Sr)FeO3 Cathodes for Solid Oxide Fuel Cells Horita T, Xiong YP, Kishimoto H, Yamaji K, Brito ME, Yokokawa H Journal of the Electrochemical Society, 157(5), B614, 2010 |
| 6 |
Strained Silicon Technology: Mobility Enhancement and Improved Short Channel Effect Performance by Stress Memorization Technique on nFET Devices Lu CC, Huang JJ, Luo WC, Hou TH, Lei TF Journal of the Electrochemical Society, 157(5), H497, 2010 |
| 7 |
Metrology for Implanted Si Substrate Loss Studies Radisic D, Shamiryan D, Mannaert G, Boullart W, Rosseel E, Bogdanowicz J, Goossens J, Marrant K, Bender H, Sonnemans R, Berry I Journal of the Electrochemical Society, 157(5), H580, 2010 |
| 8 |
Electrochemical Performance and Stability of the Cathode for Solid Oxide Fuel Cells Zhou XD, Templeton JW, Zhu Z, Chou YS, Maupin GD, Lu Z, Brow RK, Stevenson JW Journal of the Electrochemical Society, 157(7), B1019, 2010 |
| 9 |
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment Giubertoni D, Pepponi G, Sahiner MA, Kelty SP, Gennaro S, Bersani M, Kah M, Kirkby KJ, Doherty R, Foad MA, Meirer F, Streli C, Woicik JC, Pianetta P Journal of Vacuum Science & Technology B, 28(1), C1B1, 2010 |
| 10 |
Plasma doping two-dimensional characterization using low energy x-ray emission spectroscopy and full wafer secondary ion mass spectrometry/angle-resolved x-ray electron spectroscopy techniques Qin S, Morinville W, Zhuang K, Fabreguette F, McTeer A, Hu YJ, Lu SF Journal of Vacuum Science & Technology B, 28(1), C1D1, 2010 |