검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
SIMS quantitative depth profiling of matrix elements in semiconductor layers Guryanov G, Clair TPS, Bhat R, Caneau C, Nikishin S, Borisov B, Budrevich A Applied Surface Science, 252(19), 7208, 2006 |
| 2 |
In situ observation of heteroepitaxial beta-FeSi2 during electron-beam irradiation Han M, Bennett JC, Zhang Q, Tanaka M, Takeguchi M, Furuya K Thin Solid Films, 514(1-2), 58, 2006 |