검색결과 : 3건
No. | Article |
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1 |
Influence of thermal oxidation on the interfacial properties of ultrathin strained silicon layers Ioannou-Sougleridis V, Kelaidis N, Skarlatos D, Tsamis C, Georga SN, Krontiras CA, Komninou P, Speliotis T, Dimitrakis P, Kellerman B, Seacrist M Thin Solid Films, 519(16), 5456, 2011 |
2 |
Noise reduction of a-Si(1-x)Ge(x)O(y) microbolometers by forming gas passivation Rana MM, Butler DP Thin Solid Films, 516(18), 6499, 2008 |
3 |
Comparative study of negative cluster emission in sputtering of Si, Ge and their oxides Perego M, Ferrari S, Fanciulli M Applied Surface Science, 252(19), 7236, 2006 |