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| No. | Article |
|---|---|
| 1 |
Spectroscopic ellipsometry and photoluminescence measurements of as-deposited and annealed silicon rich oxynitride films Kohli S, Theil JA, McCurdy PR, Dippo PC, Ahrenkiel RK, Rithner CD, Dorhout PK Thin Solid Films, 516(12), 4342, 2008 |