| 1 |
X-ray diffraction stress analysis of interrupted titanium nitride films: Combining the sin(2)psi and crystallite group methods
Sinkovits T, Zhao Y, O'Brien R, Dowey S
Thin Solid Films, 562, 206, 2014 |
| 2 |
Stress measurement in coarse grained material with high-resolution X-ray beams
Ortner B
Thin Solid Films, 530, 77, 2013 |
| 3 |
Determination of Young's modulus and Poisson's ratio of thin films by combining sin(2)psi X-ray diffraction and laser curvature methods
Chang JY, Yu GP, Huang JH
Thin Solid Films, 517(24), 6759, 2009 |
| 4 |
Determination of residual stress fields with high local resolution
Hasse B, Kocak M, Reimers W
Materials Science Forum, 524-525, 279, 2006 |
| 5 |
Plastic heterogeneities characterisation in 16MND5 RPV steel by X-Ray diffraction, comparison with Finite-Elements approach
Mathieu JP, Bouscaud D, Inal K, Berveiller S, Diard O
Materials Science Forum, 524-525, 523, 2006 |
| 6 |
Stress determination during the mechanically-induced martensite phase transformation in the superelastic alloy CuAIBe by neutron diffraction
Malard B, Pirling T, Inal K, Patoor E, Berveiller S
Materials Science Forum, 524-525, 905, 2006 |
| 7 |
Investigations of intrinsic strain and structural ordering in a-Si : H using synchrotron radiation diffraction
Harting M, Britton DT, Minani E, Ntsoane TP, Topic M, Thovhogi T, Osiele OM, Knoesen D, Harindintwari S, Furlan F, Giles C
Thin Solid Films, 501(1-2), 75, 2006 |
| 8 |
Residual surface stress measurements in YBa(2)CU(3)Ox superconductors
Ziq KA, Shirokoff J, Alfaer SN
Applied Surface Science, 252(4), 916, 2005 |
| 9 |
Stress in hydrogenated amorphous silicon determined by X-ray diffraction
Harting M, Woodford S, Knoesen D, Bucher R, Britton DT
Thin Solid Films, 430(1-2), 153, 2003 |
| 10 |
Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction
Ma CH, Huang JH, Chen H
Thin Solid Films, 418(2), 73, 2002 |
