검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Implantation-caused open volume defects in Ge after flash lamp annealing (FLA) probed by slow positron implantation spectroscopy (SPIS) Anwand W, Skorupa W, Schumann T, Posselt M, Schmidt B, Grotzschel R, Brauer G Applied Surface Science, 255(1), 81, 2008 |
| 2 |
Hydrogen-induced buckling of Pd films studied by positron annihilation Cizek J, Prochazka I, Vlach M, Zaludova N, Danis S, Dobron P, Chmelik F, Brauer G, Anwand W, Mucklich A, Nikitin E, Gemma R, Kirchheim R, Pundt A Applied Surface Science, 255(1), 241, 2008 |
| 3 |
Defect studies of hydrogen-loaded nanocrystalline Gd films Cizek J, Prochazka I, Vlach M, Zaludova N, Danis S, Brauer G, Anwand W, Mucklich A, Gemma R, Kirchheim R, Pundt A Applied Surface Science, 255(1), 251, 2008 |
| 4 |
Defect studies of hydrogen-loaded thin Nb films Cizek J, Prochazka I, Brauer G, Anwand W, Mucklich A, Kirchheim R, Pundt A, Bahtz D, Knapp M Applied Surface Science, 252(9), 3237, 2006 |
| 5 |
Defects in nanocrystalline Nb films: Effect of sputtering temperature Cizek J, Melikhova O, Prochazka I, Brauer G, Anwand W, Mucklich A, Kirchheim R, Pundt A Applied Surface Science, 252(9), 3245, 2006 |
| 6 |
Slow positron beam investigations of defects caused by B(+) implantation into epitaxial 6H-SiC Anwand W, Brauer G, Kuriplach J, Skorupa W Materials Science Forum, 445-6, 36, 2004 |
| 7 |
Reliability test of a PAL spectrometer - Selected results on Fe Beck SMT, Brauer G, Anwand W, Berant Z, Shahal O, Ganor M, Israelashwily I Materials Science Forum, 445-6, 495, 2004 |
| 8 |
The influence of substrate temperature on the evolution of ion implantation-induced defects in epitaxial 6H-SiC Anwand W, Brauer G, Wirth H, Skorupa W, Coleman PG Applied Surface Science, 194(1-4), 127, 2002 |
| 9 |
Vacancy-type defects in 6H-SiC caused by N+ and Al+ high fluence co-implantation Anwand W, Brauer G, Skorupa W Applied Surface Science, 194(1-4), 131, 2002 |
| 10 |
The migration of defects and nitrogen atoms in nitrided surface layers of austenitic stainless steel followed by microscopic methods Jiraskova Y, Brauer G, Schneeweiss O, Blawert C, Anwand W, Coleman PG Applied Surface Science, 194(1-4), 145, 2002 |