검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies Brauer G, Anwand W, Eichhorn F, Skorupa W, Hofer C, Teichert C, Kuriplach J, Cizek J, Prochazka I, Coleman PG, Nozawa T, Kohyama A Applied Surface Science, 252(9), 3342, 2006 |
| 2 |
Further indication of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy Brauer G, Becvar F, Anwand W, Skorupa W Applied Surface Science, 252(9), 3368, 2006 |
| 3 |
Evolution of ion implantation-caused vacancy-type defects in 6H-SiC probed by slow positron implantation spectroscopy Anwand W, Brauer G, Skorupa W Applied Surface Science, 184(1-4), 247, 2001 |