검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Defect spectroscopy using 1/f(gamma) noise of gate leakage current in ultrathin oxide MOSFETs Lee J, Bosman G Solid-State Electronics, 47(11), 1973, 2003 |
| No. | Article |
|---|---|
| 1 |
Defect spectroscopy using 1/f(gamma) noise of gate leakage current in ultrathin oxide MOSFETs Lee J, Bosman G Solid-State Electronics, 47(11), 1973, 2003 |