| 1 |
Fabrication of carbon films with similar to 500 nm holes for cryo-EM with a direct detector device
Marr CR, Benlekbir S, Rubinstein JL
Journal of Structural Biology, 185(1), 42, 2014 |
| 2 |
Electron microscopy of biotinylated protein complexes bound to streptavidin monolayer crystals
Han BG, Walton RW, Song A, Hwu P, Stubbs MT, Yannone SM, Arbelaez P, Dong M, Glaeser RM
Journal of Structural Biology, 180(1), 249, 2012 |
| 3 |
Resurrecting dirty atomic force microscopy calibration standards
Chernoff DA, Sherman R
Journal of Vacuum Science & Technology B, 28(3), 643, 2010 |
| 4 |
Improved specimen preparation for cryo-electron microscopy using a symmetric carbon sandwich technique
Gyobu N, Tani K, Hiroaki Y, Kamegawa A, Mitsuoka K, Fujiyoshi Y
Journal of Structural Biology, 146(3), 325, 2004 |
| 5 |
Cryo-negative staining reduces electron-beam sensitivity of vitrified biological particles
De Carlo S, El-Bez C, Alvarez-Rua C, Borge J, Dubochet J
Journal of Structural Biology, 138(3), 216, 2002 |
| 6 |
Cross-sectional transmission electron microscopy of carbon nanotubes-catalyst-substrate heterostructure using a novel method for specimen preparation
Park JB, Cho YS, Hong SY, Choi KS, Kim D, Choi SY, Ahn SD, Song YH, Lee JH, Cho KI
Thin Solid Films, 415(1-2), 78, 2002 |
| 7 |
Cantilever technique for the preparation of cross sections for transmission electron microscopy using a focused ion beam workstation
Langford RM, Reeves CM, Goodall JG, Findlay J, Jeffree CE
Journal of Vacuum Science & Technology B, 18(1), 100, 2000 |
| 8 |
TEM investigation of wear mechanisms during metal machining
Ruppi S, Halvarsson M
Thin Solid Films, 353(1-2), 182, 1999 |
| 9 |
Investigation of Thin-Film Transistors Using a Combination of Focused Ion-Beam Etching and Cross-Sectional Transmission Electron-Microscopy Observation
Tsuji S, Tsujimoto K, Tsutsui N, Miura N, Kuroda K, Saka H
Thin Solid Films, 281-282, 562, 1996 |
