| 1 |
Spectroscopic Methods to Investigate Liquid-Porous Material Interactions: An Overview of Optical and Electrical Impedance Techniques
Tomozeiu N
Transport in Porous Media, 115(3), 603, 2016 |
| 2 |
Spectroelectrochemical investigation of the anodic and cathodic behaviour of zinc in 5.3 M KOH
Mele C, Bozzini B
Journal of Applied Electrochemistry, 45(1), 43, 2015 |
| 3 |
Chemical and optical profiling of ultra thin high-k dielectrics on silicon
Bernardini S, MacKenzie M, Buiu O, Bailey P, Noakes TCQ, Davey WM, Hamilton B, Hall S
Thin Solid Films, 517(1), 459, 2008 |
| 4 |
Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition
Matsumoto K, Maeda H, Kawaguchi Y, Takahashi K, Aoyama M, Yamaguchi T, Postava K
Thin Solid Films, 455-56, 339, 2004 |
| 5 |
Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si
Karmakov I, Chakarov I, Konova A
Applied Surface Science, 211(1-4), 270, 2003 |
| 6 |
Microstructural and optical properties of as-deposited LPCVD silicon films
Modreanu M, Tomozeiu N, Gartner M, Cosmin P
Thin Solid Films, 383(1-2), 254, 2001 |
| 7 |
Surface orientation of liquid crystals: director fluctuation and optical flickering effect in nematic liquid crystals studied by total reflection spectroellipsometry
Tadokoro T, Akao K, Okutani S, Kimura M, Akahane T, Toriumi H
Thin Solid Films, 393(1-2), 53, 2001 |
| 8 |
Spectroscopic ellipsometry: a historical overview
Vedam K
Thin Solid Films, 313-314, 1, 1998 |
| 9 |
Advances in multichannel spectroscopic ellipsometry
Collins RW, An I, Fujiwara H, Lee JC, Lu YW, Koh JY, Rovira PI
Thin Solid Films, 313-314, 18, 1998 |
| 10 |
Application of real-time spectroscopic ellipsometry for the development of low-temperature diamond film growth processes
Lee J, Hong BY, Messier R, Collins RW
Thin Solid Films, 313-314, 506, 1998 |
