| 1 |
Effect of balanced and unbalanced magnetron sputtering processes on the properties of SnO2 thin films
Shanker G, Prathap P, Srivatsa KMK, Singh P
Current Applied Physics, 19(6), 697, 2019 |
| 2 |
Spectroscopic ellipsometer study of laser ablation wavelength dependent growth kinetics of Ag nanoislands: An insight to potential plasmonic applications
Arya M, Dewasi A, Mitra A
Applied Surface Science, 447, 87, 2018 |
| 3 |
Study on the Relation Between Rubbing Conditions and Physical Parameters of Polyimide
Son PK, Choi SW
Molecular Crystals and Liquid Crystals, 546, 26, 2011 |
| 4 |
Effects of physical growth conditions on the structural and optical properties of sputtered grown thin HfO2 films
Aygun G, Cantas A, Simsek Y, Turan R
Thin Solid Films, 519(17), 5820, 2011 |
| 5 |
Ellipsometric investigation of optical constant and energy band gap of Zn1-xMnxSe/GaAs (100) epilayers
Kim DJ, Yu YM, Choi YD, Lee JW
Applied Surface Science, 252(16), 5745, 2006 |
| 6 |
Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry
Boher P, Stehle JL
Thin Solid Films, 318(1-2), 120, 1998 |
