검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
A review of characterization of perovskite film in solar cells by spectroscopic ellipsometry Li HH, Cui CC, Xu XP, Bian SB, Ngaojampa C, Ruankham P, Jaroenjittchai AP Solar Energy, 212, 48, 2020 |
| 2 |
Magneto-optical Kerr-effect studies on copper oxide thin films produced by atomic layer deposition on SiO2 Fronk M, Muller S, Waechtler T, Schulz SE, Mothes R, Lang H, Zahn DRT, Salvan G Thin Solid Films, 520(14), 4741, 2012 |
| 3 |
The novel usage of spectroscopic ellipsometry for the development of amorphous Si solar cells Lee SY, Shim JH, You DJ, Ahn SW, Lee HM Solar Energy Materials and Solar Cells, 95(1), 142, 2011 |
| 4 |
Carrier concentration dependent optical properties of wurzite InN epitaxial films on Si(111) studied by spectroscopic ellipsometry Ahn H, Shen CH, Wu CL, Gwo S Thin Solid Films, 494(1-2), 69, 2006 |
| 5 |
Self-assembled monolayers of a novel diacetylene on gold Cavalleri O, Prato M, Chincarini A, Rolandi R, Canepa M, Gliozzi A, Alloisio M, Lavagnino L, Cuniberti C, Dell'Erba C, Dellepiane G Applied Surface Science, 246(4), 403, 2005 |
| 6 |
Characterization of interfacial layer of ultrathin Zr silicate on Si(100) using spectroscopic ellipsometry and HRTEM Ahn H, Chen HW, Landheer D, Wu X, Chou LJ, Chao TS Thin Solid Films, 455-56, 318, 2004 |
| 7 |
Ellipsometry characterization of oxidized copper layers for chemical mechanical polishing process Nishizawa H, Tateyama Y, Saitoh T Thin Solid Films, 455-56, 491, 2004 |
| 8 |
Optical characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films Schmidt C, Petrik P, Schneider C, Fried M, Lohner T, Barsony I, Gyulai J, Ryssel H Thin Solid Films, 455-56, 495, 2004 |
| 9 |
The investigation of 4H-SiC/SiO2 interfaces by optical and electrical measurements Ishida Y, Takahashi T, Okumura H, Jikimoto T, Tsuchida H, Yoshikawa M, Tomioka Y, Midorikawa M, Hijikata Y, Yoshida S Materials Science Forum, 389-3, 1013, 2002 |
| 10 |
Characterization of the interfaces between SiC and oxide films by spectroscopic ellipsometry Tomioka Y, Iida T, Midorikawa M, Tukada H, Yoshimoto K, Hijikata Y, Yaguchi H, Yoshikawa M, Ishida Y, Kosugi R, Yoshida S Materials Science Forum, 389-3, 1029, 2002 |