검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films Yan XL, Coetsee E, Wang JY, Swart HC, Terblans JJ Applied Surface Science, 411, 73, 2017 |
| 2 |
Evaluation of the depth resolutions of Auger electron spectroscopic, X-ray photoelectron spectroscopic and time-of-flight secondary-ion mass spectrometric sputter depth profiling techniques Wang JY, Starke U, Mittemeijer EJ Thin Solid Films, 517(11), 3402, 2009 |
| 3 |
Quantitative evaluation of sputtering induced surface roughness in depth profiling of polycrystalline multilayers using Auger electron spectroscopy Wang JY, Hofmann S, Zalar A, Mittemeijer EJ Thin Solid Films, 444(1-2), 120, 2003 |