검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Real-space insight in the nanometer scale roughness development during growth and ion beam polishing of molybdenum silicon multilayer films Zoethout E, Louis E, Bijkerk F Applied Surface Science, 285, 293, 2013 |
| 2 |
Effect of interface grading and lateral thickness variation on x-ray diffraction by InGaN/GaN multiple quantum wells Lee SR, Koleske DD, Crawford MH, Wierer JJ Journal of Crystal Growth, 355(1), 63, 2012 |
| 3 |
X-ray reflectivity studies of highly crystalline CeO2 films on (1(1)under-bar-02) Al2O3 Bang SH, Cho JH, Kim HK, Cho HJ Applied Surface Science, 174(3-4), 257, 2001 |
| 4 |
Ultra-thin oxides grown on silicon (100) by rapid thermal oxidation for CMOS and advanced devices Mur P, Semeria MN, Olivier M, Papon AM, Leroux C, Reimbold G, Gentile P, Magnea N, Baron T, Clerc R, Ghibaudo G Applied Surface Science, 175, 726, 2001 |