| 1 |
Surface and interface properties of ZrO2/GaAs, SiO2/GaAs and GaP/GaAs hetero structures investigated by surface photovoltage spectroscopy
Roychowdhury R, Dixit VK, Vashisht G, Sharma TK, Mukherjee C, Rai SK, Kumar S
Applied Surface Science, 476, 615, 2019 |
| 2 |
Path of ordering under confinement in alloy films
Xu ZJ, Hao ZH, Ni J, Iwata S
Thin Solid Films, 517(5), 1848, 2009 |
| 3 |
Surface state density distribution at vacuum-annealed InP(100) surface as derived from the rigorous analysis of photoluminescence efficiency
Tomkiewicz P, Adamowicz B, Miczek M, Hasegawa H, Szuber J
Applied Surface Science, 254(24), 8046, 2008 |
| 4 |
Study of the hBN/InP interface by deep level transient and photoluminescence spectroscopies
Mattalah M, Telia A, Soltani A, De Jaeger JC, Thevenin P, Bath A, Akkal B, Abid H
Thin Solid Films, 516(12), 4122, 2008 |
| 5 |
Profiling the hot carrier induced damage in InP/InGaAs/InP double heterojunction bipolar transistors by using a current transient technique
Ng CW, Wang H
Thin Solid Films, 515(10), 4390, 2007 |
| 6 |
Structural and electrical properties of room temperature pulsed laser deposited and post-annealed thin SrRuO3 films
Gautreau O, Harnagea C, Normandin F, Veres T, Pignolet A
Thin Solid Films, 515(11), 4580, 2007 |
| 7 |
Monitoring interface traps in operating organic light-emitting diodes using impedance spectroscopy
Pingree LSC, Russell MT, Marks TJ, Hersam MC
Thin Solid Films, 515(11), 4783, 2007 |
| 8 |
Theoretical absorption spectra of silicon carbide nanocrystals
Shi SL, Xu SJ, Wang XJ, Chen GH
Thin Solid Films, 495(1-2), 404, 2006 |
| 9 |
Modem techniques for surface and thin film analysis
Rupertus V
Thin Solid Films, 502(1-2), 170, 2006 |
| 10 |
Structure and surface termination of ZnO films grown on (0001)- and (11(2)over-bar-0)-oriented Al2O3
Ay M, Nefedov A, Girol SG, Woll C, Zabel H
Thin Solid Films, 510(1-2), 346, 2006 |
