검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Fractals and superstructures in gadolinia thin film morphology: Influence of process variables on their characteristic parameters Sahoo NK, Thakur S, Tokas RB Thin Solid Films, 503(1-2), 85, 2006 |
| 2 |
Characterization of microroughness parameters in gadolinium oxide thin films: A study based on extended power spectral density analyses Senthilkumar M, Sahoo NK, Thakur S, Tokas RB Applied Surface Science, 252(5), 1608, 2005 |
| 3 |
Adhesion improvement of electroless copper to a polyimide film substrate by combining surface microroughening and imide ring cleavage Wang ZL, Furuya A, Yasuda K, Ikeda H, Baba T, Hagiwara M, Toki S, Shingubara S, Kubota H, Ohmi T Journal of Adhesion Science and Technology, 16(8), 1027, 2002 |
| 4 |
Effects of initial nitridation on the characteristics of SiC-SiO2 interfaces Cheong KY, Dimitrijev S, Han J Materials Science Forum, 433-4, 583, 2002 |
| 5 |
Influence of Interface Roughness on Silicon-Oxide Thickness Measured by Ellipsometry Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), L231, 1997 |
| 6 |
Nonparticulate Origins of Light Point-Defects on Polished Silicon-Wafers Shen JJ, Cook LM, Pierce KG, Loncki SB Journal of the Electrochemical Society, 143(6), 2068, 1996 |
| 7 |
Standardized Procedure for Calibrating Height Scales in Atomic-Force Microscopy on the Order of 1 nm Suzuki M, Aoyama S, Futatsuki T, Kelly AJ, Osada T, Nakano A, Sakakibara Y, Suzuki Y, Takami H, Takenobu T, Yasutake M Journal of Vacuum Science & Technology A, 14(3), 1228, 1996 |