검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique Gui D, Mo ZQ, Xing ZX, Huang YH, Hua YN, Zhao SP, Cha LZ Applied Surface Science, 255(4), 1437, 2008 |
| 2 |
Accurate depth profiling for ultra-shallow implants using backside-SIMS Hongo C, Tomita M, Takenaka M Applied Surface Science, 231-2, 673, 2004 |
| 3 |
The dose dependence of Si sputtering with low energy ions in shallow depth profiling Moon DW, Lee HI Applied Surface Science, 203, 27, 2003 |
| 4 |
Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS Hongo C, Tomita A, Takenaka M, Murakoshi A Applied Surface Science, 203, 264, 2003 |
| 5 |
Comments on on an exact analytical solution of the Boussinesq equation, Transport in Porous Media 39, 339-345, 2000 Kacimov AR, Serrano SE Transport in Porous Media, 52(3), 389, 2003 |