| 1 |
A new method for characterization of gate overlap capacitances and effective channel size in MOSFETs
Tomaszewski D, Gluszko G, Kucharski K, Malesinska J
Solid-State Electronics, 159, 184, 2019 |
| 2 |
Effect of crystallinity on microwave tunability of pulsed laser deposited Ba0.5Sr0.5TiO3 thin films
Goud JP, Ramakanth S, Joseph A, Sandeep K, Rao GL, Raju KCJ
Thin Solid Films, 626, 126, 2017 |
| 3 |
A study of short stack with large area solid oxide fuel cells by aqueous tape casting
Zhou J, Liu QL, Zhang L, Chan SH
International Journal of Hydrogen Energy, 41(40), 18203, 2016 |
| 4 |
A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM
Aziza H, Bocquet M, Moreau M, Portal JM
Solid-State Electronics, 103, 73, 2015 |
| 5 |
Test structure and method for the experimental investigation of internal voltage amplification and surface potential of ferroelectric MOSFETs
Rusu A, Salvatore GA, Ionescu AM
Solid-State Electronics, 65-66, 151, 2011 |
| 6 |
A 65 nm test structure for SRAM device variability and NBTI statistics
Fischer T, Amirante E, Huber P, Hofmann K, Ostermayr M, Schmitt-Landsiedel D
Solid-State Electronics, 53(7), 773, 2009 |
| 7 |
A comparative study of different contact resistance test structures dedicated to the power process technology
Oussalah S, Djezzar B, Jerisian R
Solid-State Electronics, 49(10), 1617, 2005 |
| 8 |
Injection technique for the study of solar cell test structures
Ciach R, Dotsenko YP, Naumov VV, Shmyryeva AN, Smertenko PS
Solar Energy Materials and Solar Cells, 76(4), 613, 2003 |
| 9 |
Select transistor modulated cell array structure test application in EEPROM process reliability
Pio F, Gomiero E
Solid-State Electronics, 45(8), 1279, 2001 |
