검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Shallow dopant and surface levels in 6H-SiC MOS structures studied by thermally stimulated current technique Lysenko VS, Osiyuk IP, Rudenko TE, Tyagulski IP, Sveinbjornsson EO, Olafsson HO Materials Science Forum, 353-356, 479, 2001 |