검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Using a fast dual-wavelength imaging ellipsometric system to measure the flow thickness profile of an oil thin film Kuo CW, Han CY, Jhou JY, Peng ZY Applied Surface Science, 421, 465, 2017 |
| 2 |
Some comments on the use of the EIS phase angle to evaluate organic coating degradation Touzain S Electrochimica Acta, 55(21), 6190, 2010 |
| 3 |
An angular distribution function for the sputter-depositing atoms and general equations describing the initial thickness profile of a thin film deposited inside a via and trench by sputtering Kim CG, Lee WJ Thin Solid Films, 519(1), 74, 2010 |
| 4 |
Real time determination of film thickness homogeneity profiles of single silver layer products produced on an industrial magnetron line Anderson C Thin Solid Films, 502(1-2), 158, 2006 |
| 5 |
Geometric analysis of thinning during superplastic forming Garriga-Majo D, Curtis RV Materials Science Forum, 357-3, 213, 2001 |