검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Defect characterization in 3C-SiC films grown on thin and thick silicon top layers of SIMOX Hong MH, Chung J, Namavar F, Pirouz P Materials Science Forum, 338-3, 525, 2000 |
| No. | Article |
|---|---|
| 1 |
Defect characterization in 3C-SiC films grown on thin and thick silicon top layers of SIMOX Hong MH, Chung J, Namavar F, Pirouz P Materials Science Forum, 338-3, 525, 2000 |