| 1 |
Controlled kinetic Monte Carlo simulation of laser improved nano particle deposition process
Song JH, Choi KH, Dai RN, Choi JO, Ahn SH, Wang Y
Powder Technology, 325, 651, 2018 |
| 2 |
Characterization of thin SiGe layers on Si (001) by spectroscopic ellipsometry for Ge fractions from 0 to 100%
Schmidt J, Eilert M, Peters S, Wietler TF
Applied Surface Science, 421, 772, 2017 |
| 3 |
Optical properties of Ba0.6K0.4Fe2As2 thin film prepared by pulsed laser deposition and subsequent post-annealing process
Lee S, Seo YS, Roh S, Lee NH, Kang WN, Hwang J
Current Applied Physics, 17(7), 976, 2017 |
| 4 |
Glow discharge optical emission spectroscopy for accurate and well resolved analysis of coatings and thin films
Wilke M, Teichert G, Gemma R, Pundt A, Kirchheim R, Romanus H, Schaaf P
Thin Solid Films, 520(5), 1660, 2011 |
| 5 |
Optical analysis of coatings by variable angle spectrophotometry
Van Nijnatten PA
Thin Solid Films, 516(14), 4553, 2008 |
| 6 |
Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
Barna A, Menyhard A, Zalar A, Panjan P
Applied Surface Science, 242(3-4), 375, 2005 |
| 7 |
Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections
Scheithauer U
Applied Surface Science, 179(1-4), 20, 2001 |
