검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Evolution of the Al2O3/Ge(100) interface for reactively sputter-deposited films submitted to postdeposition anneals Bom NM, Soares GV, Krug C, Pezzi RP, Baumvol IJR, Radtke C Applied Surface Science, 258(15), 5707, 2012 |
| 2 |
Influence of processing and annealing steps on electrical properties of InAlN/GaN high electron mobility transistor with Al2O3 gate insulation and passivation Cico K, Gregusova D, Kuzmik J, Jurkovic M, Alexewicz A, Poisson MAD, Pogany D, Strasser G, Delage S, Frohlich K Solid-State Electronics, 67(1), 74, 2012 |
| 3 |
Surface morphology study on chromium oxide growth on Cr films by Nd-YAG laser oxidation process Dong QZ, Hu JD, Guo ZX, Lian JS, Chen JW, Chen B Applied Surface Science, 202(1-2), 114, 2002 |