검색결과 : 1건
No. | Article |
---|---|
1 |
Transient blocking characteristics of highly efficient junction isolations based on standard CMOS process Starke TKH, Igic PM Solid-State Electronics, 49(7), 1217, 2005 |
No. | Article |
---|---|
1 |
Transient blocking characteristics of highly efficient junction isolations based on standard CMOS process Starke TKH, Igic PM Solid-State Electronics, 49(7), 1217, 2005 |