검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Application of ellipsometry for the accurate oxide layer measurement on silicon spheres Busch I, Liu WD, Chen C, Luo ZY, Koenders L Applied Surface Science, 421, 624, 2017 |
| 2 |
Method of observation of low density interface states by means of X-ray photoelectron spectroscopy under bias and passivation by cyanide ions Kobayashi H, Sakurai T, Yamashita Y, Kubota T, Maida O, Takahashi M Applied Surface Science, 252(21), 7700, 2006 |