검색결과 : 11건
No. | Article |
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1 |
Cobalt-nickel bimetallic Fischer-Tropsch catalysts: A combined theoretical and experimental approach van Helden P, Prinsloo F, Van den Berg JA, Xaba B, Erasmus W, Claeys M, van de Loosdrecht J Catalysis Today, 342, 88, 2020 |
2 |
Optical and structural characterization of Ge clusters embedded in ZrO2 Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P Applied Surface Science, 421, 283, 2017 |
3 |
On the Kinetic Interpretation of DFT-Derived Energy Profiles: Cu-Catalyzed Methanol Synthesis van Rensburg WJ, Petersen MA, Datt MS, van den Berg JA, van Helden P Catalysis Letters, 145(2), 559, 2015 |
4 |
A Statistical Approach to Microkinetic Analysis van Helden P, van den Berg JA, Coetzer RLJ Industrial & Engineering Chemistry Research, 51(19), 6631, 2012 |
5 |
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si Mohacsi I, Petrik P, Fried M, Lohner T, van den Berg JA, Reading MA, Giubertoni D, Barozzi M, Parisini A Thin Solid Films, 519(9), 2847, 2011 |
6 |
High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers Reading MA, van den Berg JA, Zalm PC, Armour DG, Bailey P, Noakes TCQ, Parisini A, Conard T, De Gendt S Journal of Vacuum Science & Technology B, 28(1), C1C65, 2010 |
7 |
Characterization of an ultrashallow junction structure using angle resolved x-ray photoelectron spectroscopy and medium energy ion scattering Saheli G, Conti G, Uritsky Y, Foad MA, Brundle CR, Mack P, Kouzminov D, Werner M, van den Berg JA Journal of Vacuum Science & Technology B, 26(1), 298, 2008 |
8 |
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants Giubertoni D, Bersani A, Barozzi M, Pederzoli S, Iacob E, van den Berg JA, Werner M Applied Surface Science, 252(19), 7214, 2006 |
9 |
Ultralow energy ion beam surface modification of low density polyethylene Shenton MJ, Bradley JW, van den Berg JA, Armour DG, Stevens GC Journal of Physical Chemistry B, 109(47), 22085, 2005 |
10 |
Characterization by medium energy ion scattering of damage and dopant profiles produced by ultrashallow B and As implants into Si at different temperatures Van den Berg JA, Armour DG, Zhang S, Whelan S, Ohno H, Wang TS, Cullis AG, Collart EHJ, Goldberg RD, Bailey P, Noakes TCQ Journal of Vacuum Science & Technology B, 20(3), 974, 2002 |