화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Cobalt-nickel bimetallic Fischer-Tropsch catalysts: A combined theoretical and experimental approach
van Helden P, Prinsloo F, Van den Berg JA, Xaba B, Erasmus W, Claeys M, van de Loosdrecht J
Catalysis Today, 342, 88, 2020
2 Optical and structural characterization of Ge clusters embedded in ZrO2
Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P
Applied Surface Science, 421, 283, 2017
3 On the Kinetic Interpretation of DFT-Derived Energy Profiles: Cu-Catalyzed Methanol Synthesis
van Rensburg WJ, Petersen MA, Datt MS, van den Berg JA, van Helden P
Catalysis Letters, 145(2), 559, 2015
4 A Statistical Approach to Microkinetic Analysis
van Helden P, van den Berg JA, Coetzer RLJ
Industrial & Engineering Chemistry Research, 51(19), 6631, 2012
5 Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si
Mohacsi I, Petrik P, Fried M, Lohner T, van den Berg JA, Reading MA, Giubertoni D, Barozzi M, Parisini A
Thin Solid Films, 519(9), 2847, 2011
6 High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers
Reading MA, van den Berg JA, Zalm PC, Armour DG, Bailey P, Noakes TCQ, Parisini A, Conard T, De Gendt S
Journal of Vacuum Science & Technology B, 28(1), C1C65, 2010
7 Characterization of an ultrashallow junction structure using angle resolved x-ray photoelectron spectroscopy and medium energy ion scattering
Saheli G, Conti G, Uritsky Y, Foad MA, Brundle CR, Mack P, Kouzminov D, Werner M, van den Berg JA
Journal of Vacuum Science & Technology B, 26(1), 298, 2008
8 Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants
Giubertoni D, Bersani A, Barozzi M, Pederzoli S, Iacob E, van den Berg JA, Werner M
Applied Surface Science, 252(19), 7214, 2006
9 Ultralow energy ion beam surface modification of low density polyethylene
Shenton MJ, Bradley JW, van den Berg JA, Armour DG, Stevens GC
Journal of Physical Chemistry B, 109(47), 22085, 2005
10 Characterization by medium energy ion scattering of damage and dopant profiles produced by ultrashallow B and As implants into Si at different temperatures
Van den Berg JA, Armour DG, Zhang S, Whelan S, Ohno H, Wang TS, Cullis AG, Collart EHJ, Goldberg RD, Bailey P, Noakes TCQ
Journal of Vacuum Science & Technology B, 20(3), 974, 2002