1 |
A General Approach to Coordination Control of Mobile Agents With Motion Constraints Zhao SY, Dimarogonas DV, Sun ZY, Bauso D IEEE Transactions on Automatic Control, 63(5), 1509, 2018 |
2 |
Semi-analytical minimum time solutions with velocity constraints for trajectory following of vehicles Frego M, Bertolazzi E, Biral F, Fontanelli D, Palopoli L Automatica, 86, 18, 2017 |
3 |
Analysis of the impedance field of saturated MOSFETs and drain thermal noise Lee KY Solid-State Electronics, 130, 63, 2017 |
4 |
Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs Ong SN, Yeo KS, Chew KWJ, Chan LHK, Loo XS, Boon CC, Do MA Solid-State Electronics, 72, 8, 2012 |
5 |
Drain current model for nanoscale double-gate MOSFETs Hariharan V, Thakker R, Singh K, Sachid AB, Patil MB, Vasi J, Rao VR Solid-State Electronics, 53(9), 1001, 2009 |
6 |
An analytical channel thermal noise model for deep-submicron MOSFETs with short channel effects Jeon J, Lee JD, Park BG, Shin H Solid-State Electronics, 51(7), 1034, 2007 |
7 |
Modelling velocity saturation and kink effects in p-channel polysilicon thin-film transistors Valletta A, Gaucci P, Mariucci L, Fortunato G Thin Solid Films, 515(19), 7417, 2007 |
8 |
Base transit time of graded-base Si/SiGe HBTs considering recombination lifetime and velocity saturation Chang ST, Liu CW, Lu SC Solid-State Electronics, 48(2), 207, 2004 |
9 |
Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs Han K, Shin H, Lee K Solid-State Electronics, 48(12), 2255, 2004 |
10 |
Improved measurements of high-field drift velocity in silicon carbide Khan IA, Cooper JA Materials Science Forum, 338-3, 761, 2000 |