1 |
Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements Mizsei J, Czett A Applied Surface Science, 301, 19, 2014 |
2 |
Electrical characterization of surface and interface potentials on SiC Mizsei J, Czett A Applied Surface Science, 258(21), 8343, 2012 |
3 |
Effect of deuterium on passivation of Si surfaces Mizsei J, Pap AE, Gillemot K, Battistig G Applied Surface Science, 256(19), 5765, 2010 |
4 |
Silicon surface passivation by static charge Mizsei J Applied Surface Science, 252(21), 7691, 2006 |
5 |
Vibrating capacitor method in the development of semiconductor gas sensors Mizsei J Thin Solid Films, 490(1), 17, 2005 |
6 |
Vibrating capacitor mapped chemical picture classification by artificial neural network Csaszar FM, Mizsei J Thin Solid Films, 490(1), 22, 2005 |
7 |
Investigation of Fermi-level pinning at silicon/porous- silicon interface by vibrating capacitor and surface photovoltage measurements Mizsei J, Shrair JA, Zolomy I Applied Surface Science, 235(3), 376, 2004 |
8 |
Chemical imaging by direct methods Mizsei J Thin Solid Films, 436(1), 25, 2003 |
9 |
Ultra-thin insulator covered silicon: potential barriers and tunnel currents Mizsei J Solid-State Electronics, 46(2), 235, 2002 |
10 |
Surface potential mapping: comparison of the vibrating capacitor and the SPV method Mizsei J Solid-State Electronics, 44(3), 509, 2000 |