검색결과 : 20건
| No. | Article |
|---|---|
| 1 |
Multifunctional ZnO:V thin films deposited by rf-magnetron sputtering from aerogel nanopowder target material El Mir L, Ghribi F, Hajiri M, Ben Ayadi Z, Djessas K, Cubukcu M, von Bardeleben HJ Thin Solid Films, 519(17), 5787, 2011 |
| 2 |
Ferromagnetism in Ga0.90Mn0.10As1-yPy: From the metallic to the impurity band conduction regime Cubukcu M, von Bardeleben HJ, Cantin JL, Vickridge I, Lemaitre A Thin Solid Films, 519(23), 8212, 2011 |
| 3 |
Elaboration and characterization of Co doped, conductive ZnO thin films deposited by radio-frequency magnetron sputtering at room temperature El Mir L, Ben Ayadi Z, Rahmouni H, El Ghoul J, Djessas K, von Bardeleben HJ Thin Solid Films, 517(21), 6007, 2009 |
| 4 |
Preparation and characterization of n-type conductive (Al, Co) co-doped ZnO thin films deposited by sputtering from aerogel nanopowders El Mir L, Ben Ayadi Z, Saadoun M, Djessas K, von Bardeleben HJ, Alaya S Applied Surface Science, 254(2), 570, 2007 |
| 5 |
Interface defects in n-type 3C-SiC/SiO2: An EPR study of oxidized porous silicon carbide single crystals von Bardeleben HJ, Cantin JL, Ke L, Shishkin Y, Devaty RP, Choyke WJ Materials Science Forum, 483, 273, 2005 |
| 6 |
Modification of the oxide/semiconductor interface by high temperature NO treatments: A combined EPR, NRA and XPS study on oxidized porous and bulk n-type 4H-SiC von Bardeleben HJ, Cantin JL, Vickridge IC, Song YW, Dhar S, Feldman LC, Williams JR, Ke L, Shishkin Y, Devaty RP, Choyke WJ Materials Science Forum, 483, 277, 2005 |
| 7 |
RBS-channeling and EPR studies of damage in 2 MeV Al2+-implanted 6H-SiC substrates Morilla A, Lopez JG, Battistig G, Cantin JL, Cheang-Wong JC, von Bardeleben HJ, Respaldiza MA Materials Science Forum, 483, 291, 2005 |
| 8 |
Microscopic structure and electrical activity of 4H-SIC/SiO2 interface defects : an EPR study of oxidized porous SiC von Bardeleben HJ, Cantin JL, Shishkin Y, Devaty RP, Choyke WJ Materials Science Forum, 457-460, 1457, 2004 |
| 9 |
Impurities and related microstructure in nanocrystalline silicon films grown by radiofrequency magnetron sputtering Goncalves C, Zeinert A, Charvet S, Lejeune M, Grosman A, von Bardeleben HJ, Zellama K Thin Solid Films, 451-52, 370, 2004 |
| 10 |
EPR studies of interface defects in n-type 6H-SiC/SiO2 using porous SiC von Bardeleben HJ, Cantin JL, Mynbaeva M, Saddow SE Materials Science Forum, 433-4, 495, 2002 |