화학공학소재연구정보센터

Nature Nanotechnology

Nature Nanotechnology, Vol.2, No.10 Entire volume, number list
ISSN: 1748-3387 (Print) 

In this Issue (18 articles)

VI - VI The many faces of nanotech
[Anonymous]
587 - 589 Cubism at the nanoscale
Toumey C
590 - 591 A career in carbon
Iijima S
595 - 596 Quantum Devices - Nanowires charge towards integration
Eriksson MA, Friesen M
596 - 597 Biosensing - Taking charge of biomolecules
Kinsella JM, Ivanisevic A
598 - 599 Nanomaterials - Paper powers battery breakthrough
Scrosati B
599 - 600 Carbon materials - Nanosynthesis by candlelight
Bottini M, Mustelin T
600 - 600 Probe microscopy - Finding quantum dots inside nanowires
Thomas J
601 - 602 Surface patterning - Self-assembly works for superlattices
Ortega JE, de Abajo FJG
605 - 615 Carbon-based electronics
Avouris P, Chen ZH, Perebeinos V
617 - 621 Nanopatterning the electronic properties of gold surfaces with self-organized superlattices of metallic nanostructures
Didiot C, Pons S, Kierren B, Fagot-Revurat Y, Malterre D
622 - 625 A Ge/Si heterostructure nanowire-based double quantum dot with integrated charge sensor
Hu YJ, Churchill HOH, Reilly DJ, Xiang J, Lieber CM, Marcus CM
626 - 630 Highly scalable non-volatile and ultra-lowpower phase-change nanowire memory
Lee SH, Jung Y, Agarwal R
631 - 634 Magnetic exchange bias of more than 1 tesla in a natural mineral intergrowth
McEnroe SA, Carter-Stiglitz B, Harrison RJ, Robinson P, Fabian K, McCammon C
635 - 639 A virus-based single-enzyme nanoreactor
Comellas-Aragones M, Engelkamp H, Claessen VI, Sommerdijk NAJM, Rowan AE, Christianen PCM, Maan JC, Verduin BJM, Cornelissen JJLM, Nolte RJM
640 - 646 Highly selective dispersion of singlewalled carbon nanotubes using aromatic polymers
Nish A, Hwang JY, Doig J, Nicholas RJ
647 - 652 Controlling optical gain in semiconducting polymers with nanoscale chain positioning and alignment
Martini IB, Craig IM, Molenkamp WC, Miyata H, Tolbert SH, Schwartz BJ
653 - 659 Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy
Sinensky AK, Belcher AM