683 - 687 |
Polymer Electrolytes Reinforced by Celgard(R) Membranes Abraham KM, Alamgir M, Hoffman DK |
687 - 696 |
Studies of Li Anodes in the Electrolyte System 2Me-THF/THF/Me-Furan/Liasf6 Aurbach D, Zaban A, Gofer Y, Abramson O, Benzion M |
696 - 702 |
Binding of Ether and Carbonyl Oxygens to Lithium Ion Blint RJ |
702 - 707 |
Kinetic-Properties of a Pt/Lambda-MnO2 Electrode for the Electroinsertion of Lithium Ions in an Aqueous-Phase Kanoh H, Feng Q, Miyai Y, Ooi K |
707 - 712 |
Electrochemical Oxidation of 1,2-Dimethoxybenzene - Characteristics and Morphology of Deposited Product Marquez OP, Fontal B, Marquez J, Ortiz R, Castillo R, Choy M, Larez C |
713 - 715 |
Quantitative Electrochemical Reduction of 1-Adamantanecarbonyl Chloride to 1-Adamantanecarboxaldehyde at Carbon and Mercury Cathodes in Acetonitrile Mubarak MS, Peters DG |
716 - 720 |
The Influence of the Graphitic Structure on the Electrochemical Characteristics for the Anode of Secondary Lithium Batteries Tatsumi K, Iwashita N, Sakaebe H, Shioyama H, Higuchi S, Mabuchi A, Fujimoto H |
721 - 724 |
In-Situ XANES Study of Galvanostatic Reduction of the Passive Film on Iron Davenport AJ, Bardwell JA, Vitus CM |
725 - 730 |
High-Resolution in-Situ XANES Investigation of the Nature of the Passive Film on Iron in a pH 8.4 Borate Buffer Davenport AJ, Sansone M |
731 - 737 |
Determination of the Critical Potentials for Pitting, Protection, and Stress-Corrosion Cracking of 67-33-Brass in Fluoride Solutions Lee CK, Shih HC |
737 - 743 |
Mathematical-Models for the Anodization Conditions and Structural Features of Porous Anodic Al2O3 Films on Aluminum Patermarakis G, Moussoutzanis K |
744 - 748 |
A Comparative-Study of the Corrosion of Tin-Free Steel and Iron in Sodium Bisulfite Seshadri G, Bower KA, Brooks RW, Kelber JA |
749 - 756 |
Atmospheric Corrosion Effects of SO2 and NO2 - A Comparison of Laboratory and Field-Exposed Copper Tidblad J, Leygraf C |
757 - 760 |
Atmospheric Corrosion Effects of SO2 and O-3 on Laboratory-Exposed Copper Zakipour S, Tidblad J, Leygraf C |
761 - 764 |
The Electrical-Conductivity of Sodium Polysulfide Melts Wang MH, Newman J |
764 - 770 |
Chemical-Bath Deposition of ZnSe Thin-Films - Process and Material Characterization Dona JM, Herrero J |
771 - 774 |
Visual Observations of Early Shape Changes in a Zinc Nickel-Oxide Cell Jorne J, Adler TC, Cairns EJ |
775 - 782 |
Electrodeposition of Binary Iron-Group Alloys Sasaki KY, Talbot JB |
782 - 787 |
Selective Electrochemical Oxidation of Coal in Aqueous Alkaline Electrolyte Ahn S, Tatarchuk BJ, Kerby MC, Davis SM |
787 - 797 |
Investigation of Porous-Electrodes by Current Interruption - Application to Molten-Carbonate Fuel-Cell Cathodes Lagergren C, Lindbergh G, Simonsson D |
798 - 805 |
Preparation and Characterization of Polyaniline-Palladium Composite Films Li HS, Josowicz M, Baer DR, Engelhard MH, Janata J |
806 - 810 |
The Role of Reducing Agent in Oxidation Reactions of Water on Illuminated TiO2 Electrodes Salama SB, Natarajan C, Nogami G, Kennedy JH |
810 - 816 |
Electrochemical Reduction of Nitrobenzaldehydes from Molten Acetamide - Evidence for Gem-Diol Formation Saraswathi R, Narayan R |
816 - 823 |
Kinetics for Electrooxidation of Ethanol on Thermally Prepared Ruthenium Oxide in Alkaline-Solution Shieh DT, Hwang BJ |
824 - 828 |
In-Situ X-Ray-Absorption Fine-Structure Measurements of Lani5 Electrodes in Alkaline Electrolytes Tryk DA, Bae IT, Hu YN, Kim SH, Antonio MR, Scherson DA |
829 - 834 |
Electrochemical and Quantum-Chemical Study of Dibenzylsulfoxide Adsorption on Iron Kutej P, Vosta J, Pancir J, Macak J, Hackerman N |
835 - 839 |
Electrochemically Active Nanocrystalline SnO2 Surface Modification with Thiazine and Oxazine Dye Aggregates Liu D, Kamat PV |
840 - 844 |
Cation Electrolytic Modification of N-WSe2/Aqueous Polyiodide Photoelectrochemistry Licht S, Myung N, Tenne R, Hodes G |
845 - 849 |
Aqueous Polyiodide Spectroscopy and Equilibria and Its Effect on N-WSe2 Photoelectrochemistry Licht S, Myung N |
850 - 862 |
Charge-Transfer at Photoelectrochemical Solar-Cells - Conclusions from the Open-Circuit Impedance of P-InP in V-3+/2+ Schefold J |
862 - 867 |
An ESR-Electrochemical Cell Which Can Be Used in High and Low Dielectric Solvents over Wide Ranges of Temperature and Time-Domain Fiedler DA, Koppenol M, Bond AM |
868 - 874 |
Characterization of Xf(2)/(1-X)Agpo3 and Xagf/(1-X)Agpo3 Glasses Chowdari BV, Mok KF, Xie JM, Gopalakrishnan R |
874 - 879 |
Electrical-Transport in RbCl-Al2O3 Composite Solid Electrolytes Kumar A, Shahi K |
879 - 882 |
Evidence for an Ideal Transparent Anodic Oxide Film on Zirconium Ord JL, Desmet DJ |
883 - 887 |
Abnormal High-Rate Deposition of Tin Films by the Radio-Frequency Plasma-Jet System Barankova H, Bardos L, Berg S |
888 - 897 |
Application of Ion Mobility Spectrometry to Semiconductor Technology - Outgassings of Advanced Polymers Under Thermal-Stress Budde KJ, Holzapfel WJ, Beyer MM |
898 - 902 |
Microstructure, Electrical-Properties and Passivation of Defects at the Silicon-Silicon-Dioxide Interface Correia A, Ballutaud D, Maurice JL |
902 - 907 |
A Less Critical Cleaning Procedure for Silicon-Wafer Using Diluted HF Dip and Boiling in Isopropyl-Alcohol as Final Steps Filho SG, Hasenack CM, Salay LC, Mertens P |
907 - 913 |
Spin-Coating on Substrate with Topography Gu J, Bullwinkel MD, Campbell GA |
913 - 917 |
Effects of Cobalt Silicidation on the Electrical Characteristics of Shallow P(+)N Junctions Formed by Bf2+ Implantation into Thin Polycrystalline Si Films Lin CT, Chao CH, Juang MH, Jan ST, Chou PF, Cheng HC |
918 - 925 |
Relationship Between Chemical-Composition and Film Properties of Organic Spin-on Glass Nakano T, Ohta T |
925 - 930 |
A Comparison of the Oxidation-Kinetics of SiC and Si3N4 Ogbuji LU, Opila EJ |
930 - 934 |
Voltage and Fluence Dependence of Stress-Generated Traps Inside Thin Silicon-Oxide Scott RS, Subramonium R, Dumin DJ |
934 - 938 |
Decomposition Property of Methylhydrazine with Titanium Nitridation at Low-Temperature Ohba T, Suzuki T, Yagi H, Furumura Y, Hatano T |
939 - 944 |
Enhanced Chemical-Vapor-Deposition of Copper from (Hfac)Cu(Tmvs) Using Liquid Coinjection of Tmvs Petersen GA, Parmeter JE, Apblett CA, Gonzales MF, Smith PM, Omstead TR, Norman JA |
944 - 949 |
Laser-Assisted Seeding for Electroless Plating on Polyimide Surfaces Schrott AG, Braren B, Osullivan EJ, Saraf RF, Bailey P, Roldan J |
949 - 952 |
Preparation and Characterization of Zinc-Sulfide Phosphors Coated with Barium-Titanate Using Sol-Gel Method Nakamura T, Kamiya M, Watanabe H, Nakanishi Y |
952 - 957 |
Potentiometric Sensor for Monitoring the State of Oxide Catalysts Petrolekas PD, Metcalfe IS |
958 - 960 |
Positron Lifetime Spectroscopy and Cathodoluminescence of Polycrystalline Terbium-Doped Yttria Brown J, Mascher P, Kitai AH |
961 - 965 |
Reaction of 1,1,1,5,5,5-Hexafluoro-2,4-Pentanedione (H(+)Hfac) with CuO, Cu2O, and Cu Films George MA, Hess DW, Beck SE, Ivankovits JC, Bohling DA, Lane AP |
966 - 970 |
Behavior of Ultrafine Metallic Particles on Silicon-Wafer Surface Morinaga H, Futatsuki T, Ohmi T, Fuchita E, Oda M, Hayashi C |
971 - 978 |
Minimization of Particle Contamination During Wet-Processing of Si Wafers Itano M, Kezuka T, Ishii M, Unemoto T, Kubo M, Ohmi T |
979 - 985 |
Intrinsic and Extrinsic Threshold Voltage Shift Dependence on the Oxide Field-Induced During Optically Assisted Electron Injection Kim HS, Williams CK, Reisman A |
985 - 989 |
Area-Selective Diffusion of Zn in InP/In0.53Ga0.47As/InP for Lateral PN Photodiodes Klockenbrink R, Peiner E, Wehmann HH, Schlachetzki A |
990 - 996 |
Charge-Transport in Ultrathin Silicon Nitrides Kobayashi K, Teramoto A, Hirayama M |
996 - 1001 |
Observation of Ring-Osf Nuclei in Cz-Si Using Short-Time Annealing and Infrared Light-Scattering Tomography Marsden K, Sadamitsu S, Hourai M, Sumita S, Shigematsu T |
L31 - L33 |
Novel Microelectromechanical System Force Transducer to Quantify Contractile Characteristics from Isolated Cardiac-Muscle-Cells Lin G, Pister KS, Roos KP |
L34 - L35 |
Crossover Phenomenon in Oxidation Rates of the (110) and (111) Orientations of Silicon in N2O Chao TS, Lei TF |
L36 - L37 |
Dry-Etching Technique for Subquarter-Micron Copper Interconnects Igarashi Y, Yamanobe T, Ito T |
L38 - L41 |
Origin of New Bands in the Raman-Spectra of Dye Monolayers Adsorbed on Nanocrystalline TiO2 Hugotlegoff A, Falaras P |
L42 - L45 |
Electrodeposition of Metal Adlayers on Boron-Doped Diamond Thin-Film Electrodes Awada H, Strojek JW, Swain GM |
L46 - L46 |
Anisotropic Etching of Silicon in Rubidium Hydroxide (Vol 141, Pg 2493, 1994) Wang T, Surve S, Hesketh PJ |
L46 - L46 |
Steady-State Characterization of the Uniform-Injection Cell .2. Experimental-Analysis (Vol 142, Pg 457, 1995) Medina JA, Sexton DL, Schwartz DT |
1002 - 1006 |
Low-Temperature P-Doped SiC Growth by Chemical-Vapor-Deposition Using Ch3Sih3/PH3 Gas Ohshita Y |
1007 - 1014 |
Silicon Floating-Zone Process - Numerical Modeling of RF Field, Heat-Transfer, Thermal-Stress, and Experimental Proof for 4-Inch Crystals Riemann H, Ludge A, Bottcher K, Rost HJ, Hallmann B, Schroder W, Hensel W, Schleusener B |
1015 - 1020 |
Analysis of Charge Components Induced by Fowler-Nordheim Tunnel Injection in Silicon-Oxides Prepared by Rapid Thermal-Oxidation Roh Y, Trombetta L, Han J |
1021 - 1024 |
Charge Trapping and Interface State Generation in Rapid Thermal Processed Oxide and Nitrided-Oxide MOS Capacitors by Electron Photoinjection from Al Gate and Si Substrate Yuan XJ, Marsland JS, Eccleston W, Bouvet D, Mi J, Dutoit M |
1024 - 1030 |
Photoelectrochemical Diffusion Length Measurements on P-Type Multicrystalline Silicon for Photovoltaic Applications Bastide S, Vedel J, Lincot D, Le QN, Sarti D |