295 - 298 |
Effects of temperature on electronic properties of nickel phthalocyanine thin sandwich film structures Anthopoulos TD, Shafai TS |
299 - 304 |
Infrared spectroscopic study of dimethylaluminum-hydride adsorption on oxidized, hydrogen-terminated, and reconstructed Si surfaces Wadayama T, Takeuchi K, Mukai K, Tanabe T, Hatta A |
305 - 312 |
Solid particle production in fluorocarbon plasmas II: Gas phase reactions for polymerization Takahashi K, Tachibana K |
313 - 324 |
Two-dimensional modeling of long-term transients in inductively coupled plasmas using moderate computational parallelism. I. Ar pulsed plasmas Subramonium P, Kushner MJ |
325 - 334 |
Two-dimensional modeling of long-term transients in inductively coupled plasmas using moderate computational parallelism. II. Ar/Cl-2 pulsed plasmas Subramonium P, Kushner MJ |
335 - 337 |
Synthesis and mechanical properties of boron suboxide thin films Music D, Schneider JM, Kugler V, Nakao S, Jin P, Ostblom M, Hultman L, Helmersson U |
338 - 343 |
Deposition of silicon alloys in an integrated distributed electron cyclotron resonance reactor: Oxide, nitride, oxinitrides, and multilayer structures Bulkin P, Hofrichter A, Heitz T, Huc J, Drevillon B, Benattar JJ |
344 - 349 |
Influence of implantation and annealing on the surface topography of amorphous and polysilicon thin films Edrei R, Shauly EN, Hoffman A |
350 - 355 |
Metallization of poly(vinylchloride) by Fe, Ni, Cu, Ag, and Au Carlo SR, Perry C, Torres J, Fairbrother DH |
356 - 361 |
Effect of O-2 gas partial pressure on mechanical properties of SiO2 films deposited by radio frequency magnetron sputtering Fujiyama H, Sumomogi T, Endo T |
362 - 365 |
Depth distribution and diffusion behavior of implanted Bi+ ions into KTiOPO4 Wang KM, Hu H, Lu F, Chen F, Zhang JH, Liu XD, Liu JT, Liu YG |
366 - 374 |
Atomic force microscopy investigation of a-C : H films prepared by plasma enhanced chemical vapor deposition for inertial confinement fusion experiments Dumay B, Finot E, Theobald M, Legaie O, Baclet P, Durand J, Goudonnet JP |
375 - 378 |
Effect of annealing on structural and electrical properties of laser ablated Sr0.8Ba0.2Bi2Ta2O9 thin films Das RR, Bhattacharya P, Perez W, Katiyar RS |
379 - 387 |
Ionized physical vapor deposition of titanium nitride: Plasma and film characterization Mao D, Tao K, Hopwood J |
388 - 393 |
Self-cleaning and antifogging effects of TiO2 films prepared by radio frequency magnetron sputtering Zeman P, Takabayashi S |
394 - 397 |
Sulfur passivation of InP(100) by means of low energy sulfur ions Zhao Q, Kwok RWM |
398 - 402 |
Cyclic plasma deposition Of SiO2 films at low temperature (80 degrees C) with intermediate plasma treatment Yi C, Rhee SW |
403 - 407 |
Intermittent chemical vapor deposition of thick electrically conductive diamond-like amorphous carbon films using i-C4H10/N-2 supermagnetron plasma Kinoshita H, Murakami T |
408 - 412 |
Enhancement of the film growth rate by promoting iodine adsorption in the catalyst-enhanced chemical vapor deposition of Cu Kwon OK, Lee HB, Kang SW, Park HS |
413 - 423 |
Particle formation during low-pressure chemical vapor deposition from silane and oxygen: Measurement, modeling, and film properties Kim T, Suh SM, Girshick SL, Zachariah MR, McMurry PH, Rassel RM, Shen Z, Campbell SA |
424 - 429 |
Surface roughness of silicon carbide etched in a C2F6/O-2 inductively coupled plasma Kim B, Choi HJ, Lee BT |
430 - 436 |
Room-temperature fabrication of hard AIN/TiN superlattice coatings by pulsed laser deposition Pankov V, Evstigneev M, Prince RH |
437 - 440 |
High coercivity thin film for high-density magneto-optical super-resolution near-field recording Kim J, Shima T, Atoda N, Tominaga J |
441 - 446 |
Polishing effect of the plasma on the growth of YBa2Cu3O7-delta films by radio frequency sputtering Chou H, Lin PI, Hsu CC, Chow TC, Hong MT, Chen YC, Liu JR |
447 - 455 |
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon Jiricek P, Zemek J, Lejcek P, Lesiak B, Jablonski A, Ceransky M |
456 - 458 |
Effect of buffer-layer engineering on the polarity of GaN films Sumiya M, Yoshimura K, Ogusu N, Fuke S, Mizuno K, Yoshimoto M, Koinuma H, Romano LT |
459 - 466 |
Gas heating and throw distance for the sputter deposition of aluminum and tungsten Drusedau TP |
467 - 478 |
Two-dimensional pulsed-plasma simulation of a chlorine discharge Ramamurthi B, Economou DJ |
479 - 485 |
Evaluation of radio-frequency sputter-deposited textured TiN thin films as diffusion barriers between copper and silicon Chen GS, Guo JJ, Lin CK, Hsu CS, Yang LC, Fang JS |
486 - 491 |
CaWO4 thin films synthesized by pulsed laser deposition Tanaka K, Fukui K, Ohga K, Choo CK |
492 - 498 |
Comprehensive study of microcrystalline silicon solar cells deposited at high rate using 13.56 MHz plasma-enhanced chemical vapor deposition Roschek T, Repmann T, Muller J, Rech B, Wagner H |
499 - 506 |
Deposition of silicon oxychloride films on chamber walls during Cl-2/O-2 plasma etching of Si Ullal SJ, Singh H, Vahedi V, Aydil ES |
507 - 512 |
Chemical vapor deposition of HfO2 films on Si(100) Sayan S, Aravamudhan S, Busch BW, Schulte WH, Cosandey F, Wilk GD, Gustafsson T, Garfunkel E |
513 - 520 |
High-density etching plasma excitation by slot type and coaxial line type of microwave antennas Yamauchi T, Sugai H |
521 - 525 |
Cross section for removing chemisorbed oxygen from an aluminum target by sputtering Depla D, De Gryse R |
526 - 529 |
Ion energy distribution functions and Langmuir probe measurements in low pressure argon discharges Kaeppelin V, Carrere M, Layet JM |
530 - 535 |
Sputter-etching characteristics of barium-strontium-titanate and bismuth-strontium-tantalate using a surface-wave high-density plasma reactor Stafford L, Margot J, Delprat S, Chaker M, Queney D |
536 - 543 |
Methods for modeling microwave plasma system stability Rummel P, Grotjohn TA |
544 - 548 |
Improvement of oxide thickness uniformity by high then low O-2 pressure oxidation in rapid thermal processing Hong CC, Chen JL, Hwu JG |
549 - 554 |
Growth and structure control of HfO2-x films with cubic and tetragonal structures obtained by ion beam assisted deposition Manory RR, Mori T, Shimizu I, Miyake S, Kimmel G |
555 - 563 |
Determination of electron temperature, atomic fluorine concentration, and gas temperature in inductively coupled fluorocarbon/rare gas plasmas using optical emission spectroscopy Schabel MJ, Donnelly VM, Kornblit A, Tai WW |
564 - 568 |
Study of angular influence of C3H5+ ion deposition on polystyrene surfaces using molecular dynamics simulations Jang I, Ni B, Sinnott SB |
569 - 571 |
Microhardness and lattice parameter of Cr1-xAlxN films Kawate M, Kimura A, Suzuki T |
572 - 576 |
Temperature programmer for surface science studies with application to semiconductor surfaces Materer NF, Watt T |