313 - 320 |
Role of oxygen impurities in etching of silicon by atomic hydrogen Veprek S, Wang CL, Veprek-Heijman MGJ |
321 - 327 |
On the mechanism of tritium desorption from stainless steel Akaishi K, Torikai Y, Murata D, Penzhorn RD, Watanabe K, Matsuyama M |
328 - 332 |
Influence of the microstructure on steel hardening in pulsed plasma nitriding Ochoa EA, Figueroa CA |
333 - 337 |
Experimental study of Cr/Sc multilayer mirrors for the nitrogen K-alpha-emission line Hardouin A, Delmotte F, Ravet MF, Bridou F, Jerome A, Varniere F, Montcalm C, Hedacq S, Gullikson E, Aubert P |
338 - 343 |
Preparation of TiO2 thin films on the inner surface of a quartz tube using atmospheric-pressure microplasma Yoshiki H, Saito T |
344 - 351 |
Effect of gas mixing ratio on etch behavior of ZrO2 thin films in BCl3/He inductively coupled plasma Kim M, Min NK, Yun SJ, Lee HW, Efremov A, Kwon KH |
352 - 359 |
On the gas species dependence of Pirani vacuum gauges Jousten K |
360 - 364 |
Study of tungsten oxidation in O-2/H-2/N-2 downstream plasma Xu SL, Diao L |
365 - 369 |
Development of a compact vacuum- and hydrogen-annealing machine for surface transformation of silicon and its applications to micro-optical devices Kanamori Y, Douzono K, Fujihira S, Hane K |
370 - 374 |
Oxidation of silicon nanowires for top-gated field effect transistors Liu BZ, Wang YF, Ho TT, Lew KK, Eichfeld SM, Redwing JM, Mayer TS, Mohney SE |
375 - 379 |
Thermal conductivity of semi-insulating, p-type, and n-type GaN films on sapphire Jagannadham K, Berkman EA, Elmasry N |
380 - 384 |
Preparation of alpha-Al2O3 thin films by electron cyclotron resonance plasma-assisted pulsed laser deposition and heat annealing Yu D, Lu YF, Xu N, Sun J, Ying ZF, Wu JD |
385 - 388 |
Dry etching of SiGe alloys by xenon difluoride Xuan G, Adam TN, Lv PC, Sustersic N, Coppinger MJ, Kolodzey J, Suehle J, Fitzgerald E |
389 - 398 |
Tin removal from extreme ultraviolet collector optics by inductively coupled plasma reactive ion etching Shin H, Srivastava SN, Ruzic DN |
399 - 405 |
Characterization of high quality InN grown on production-style plasma assisted molecular beam epitaxy system Gherasoiu I, O'Steen M, Bird T, Gotthold D, Chandolu A, Song DY, Xu SX, Holtz M, Nikishin SA, Schaff WJ |
406 - 415 |
Experimental study of spatial nonuniformities in 100 MHz capacitively coupled plasma using optical probe Volynets VN, Ushakov AG, Sung D, Tolmachev YN, Pashkovsky VG, Lee JB, Kwon TY, Jeong KS |
416 - 421 |
Preparation and microstructural characterization of TiC and Ti0.6W0.4/TiC0.6 composite thin films obtained by activated reactive evaporation de Oca JAM, LePetitcorps Y, Manaud JP, Garcia JRV |
422 - 429 |
Sputtering rate of micromilling on water ice with focused ion beam in a cryogenic environment Fu J, Joshi SB, Catchmark JM |
430 - 437 |
Tungsten atomic layer deposition on cobalt nanoparticles Wilson CA, Goldstein DN, McCormick JA, Weimer AW, George SM |
438 - 443 |
Mechanical properties of amorphous hydrogenated carbon films fabricated on polyethylene terephthalate foils by plasma immersion ion implantation and deposition Li J, Tian XB, Yang SQ, Chu PK, Fu RKY |
444 - 454 |
Multilayer transparent electrode consisting of silver alloy layer and metal oxide layers for organic luminescent electronic display device Koike K, Fukuda S |
455 - 461 |
Recombination probability of oxygen atoms on dynamic stainless steel surfaces in inductively coupled O-2 plasmas Stafford L, Guha J, Donnelly VM |
462 - 471 |
Operational regimes of the saddle field plasma enhanced chemical vapor deposition system Johnson EV, Zukotynski S, Kherani NP |
472 - 480 |
Plasma-assisted atomic layer deposition of Ta2O5 from alkylamide precursor and remote O-2 plasma Heil SBS, Roozeboom F, van de Sanden MCM, Kessels WMM |
481 - 484 |
Dielectric properties of high-density-plasma fluorinated-silicate glass by doping nitrogen Wei BJ, Cheng YL, Wang YL, Lu FH, Shih HC |
485 - 493 |
Surface phase diagram and alloy formation for antimony on Au(110) Parihar SS, Lyman PF |
494 - 497 |
Evolution of epitaxial Ta2O5 and Ta2O films during thermal oxidation of epitaxial tantalum films on sapphire substrates Gnanarajan S, Lam SKH |
498 - 512 |
Seasoning of plasma etching reactors: Ion energy distributions to walls and real-time and run-to-run control strategies Agarwal A, Kushner MJ |
513 - 516 |
Compositional analysis of lead telluride films deposited via pulsed electron-beam ablation Steigerwald A, Aga R, Collins WE, Mu R, Hmelo AB |
517 - 521 |
Methods of producing plasma enhanced chemical vapor deposition silicon nitride thin films with high compressive and tensile stress Belyansky M, Chace M, Gluschenkov O, Kempisty J, Klymko N, Madan A, Mallikarjunan A, Molis S, Ronsheim P, Wang Y, Yang D, Li Y |
522 - 536 |
Multiparameter investigation of the sputtering behavior of Ag/Cu Alloys for low energy argon ion bombardment Pierson KW, Hawes CD, Kollwitz JT, Padron AS |
537 - 544 |
Finite element modeling and experimental validation of the sealing mechanism of the ConFlat (R) joint Lutkiewicz P, Rathjen C |
545 - 554 |
Role of chamber dimension in fluorocarbon based deposition and etching of SiO2 and its effects on gas and surface-phase chemistry Joseph EA, Zhou BS, Sant SP, Overzet LJ, Goeckner MJ |
555 - 557 |
Thermal leakage characteristics of Pt/SrTiO3/Pt structures Son J, Stemmer S |